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UDK 537.632
OPTICAL PATH OPTIMIZATION OF THE NANOMOKE2 SYSTEM USING CAD
Zaitseva Elena Ivanovna
Head of the Mathematics and Computer Science department Krasnoyarsk state agricultural university Achinsk branch Russia, city of Achinsk Kniga Yurii Anatol'evich Assistant professor of the Agroengineering department Krasnoyarsk state agricultural university Achinsk branch
Summary: the problem of computer-aided design of the optical path, which is a part of the installation NanoMOKE 2 is investigated. The possibility of design, managed set limiting conditions is shown. Using CAD systems with mathematical modeling the optimum spatial arrangement of the optical elements (mirrors) is found.
Keywords: magneto-optical Kerr effect, ellipsometry, polarized light.
Optical measurements play a key role in the cost-effective manufacturing and -on the research side - in the better understanding of the process. As a fast, non-destructive, and precise optical method, spectroscopic ellipsometry (SE) [1] has a broad range of applications, such as measurement of multilayer structures, surface roughness, composite materials like polycrystalline silicon, or damage depth profiles in ion implanted materials. In situ applications of spectroscopic ellipsometry are becoming more and more important because of its high speed and accuracy.
On the other hand magneto-optical Kerr effects (MOKE's) [2] have been utilized as a premier surface magnetism technique. Due to the sub ML sensitivity, easy implementation, and local-probing nature, the MOKE technique was applied to various topics in thin-film magnetism including the magnetic phase transition, the magnetic anisotropy, the magnetic switching process, and the spin reorientation transition.
Association of these two methods of research in the same installation opens new important experimental possibilities.
NanoMOKE2 system [3] supplied by a British company named DMO Ltd., is based on the magnetooptical Kerr-effect measured through the reflected light from a tiny laser spot (as small as 3 ^m in diameter). As part of a Lab place for magnetic characterization, it offers highest sensitivity to sample magnetization together with microscopic resolution. The NanoMOKE2 can and shall be used for a wide range of applications, from basic R&D in materials design to testing of microstructured devices.
The NanoMOKE2 can detect magnetic moments (as low as 10-15 Am2 ), collect hysteresis loops (maximum applicable field: 0.1 T), determine the magnetic anisotropy and map the magnetic susceptibility of a substance, as well as enabling of the scanning Kerr microscopy for domain imaging. Moreover, owing to its high flexibility, extensions can be introduced in future to study aspects such as magneto-resistance, electrooptical properties and spintronics.
This device is rich in opportunities for measurement of various polarization effects. However, the standard does not allow the grade change the angle of incidence on the sample in the case that the ellipsometric measurements would be desirable. At the same time, the complexity of the design makes it difficult to calculate position of the optical elements to change the angle of incidence.
Simulated optical path (fig. 1) consists of the following parts: the laser beam 1, mirrors 2 and 3, the sample 5. the electromagnet also shown in Figure 1.
In this paper we demonstrated the possibility of application of computer-aided design to simulate the optical path. The desired parameter is the angle of incidence of light on the sample 5. It is possible to change the position of the sample relative to the axis of the electromagnets 4.
Also allowed to change the spatial arrangement of mirrors 2,3. Using computer-aided design "KOMPAS" [4] was built parametric model, allows us to set the angle of incidence, and calculates the coordinates and angle of sample 5 and mirrors 2.3.
References:
1. Durham Magneto Optics Ltd NanoMOKE 2 Specifications - DMO Ltd, 2009
2. Fujiwara H. Spectroscopic Ellipsometry. Principles and Application. □ Wiley, 2007. - 369 p.
3. Bader S.D. Surface magneto-optic Kerr effect // Journal of Magnetism and Magnetic Materials. - 1991. - V.100. - P. 440-454.
4. http://kompas.r
