Научная статья на тему 'In-situ imaging and control of intense soft and hard X-ray Fel beams by fluorescent detectors with submicron resolution'

In-situ imaging and control of intense soft and hard X-ray Fel beams by fluorescent detectors with submicron resolution Текст научной статьи по специальности «Медицинские технологии»

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Похожие темы научных работ по медицинским технологиям , автор научной работы — S. S. Makarov, S. A. Pikuz, T. A. Pikuz, A. Ya. Faenov, A. N. Mitrofanov

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Текст научной работы на тему «In-situ imaging and control of intense soft and hard X-ray Fel beams by fluorescent detectors with submicron resolution»

Complex Systems of Charged Particles and their Interactions with Electromagnetic Radiation 2019

IN-SITU IMAGING AND CONTROL OF INTENSE SOFT AND HARD X-RAY FEL BEAMS BY FLUORESCENT DETECTORS WITH SUBMICRON

RESOLUTION

S.S. Makarov1,6, S.A. Pikuz1, T.A. Pikuz1,2, A.Ya. Faenov1,2, A.N. Mitrofanov1,T. Matsuoka2, S.

Matsuyama3, K. Yamauchi3, N. Ozaki3, Y. Inubushi4, M. Yabashi4,5, K. Tono4,5, Y. Sato3, H. Yumoto4, H. Ohashi4,5, A.N. Grum-Grzhimailo6, M. Nishikino7, T. Kawachi7, T. Ishikawa4,5, R.

Kodama2.

Joint Institute for High Temperatures RAS, Moscow 125412, Russia 2Institute for Academic Initiatives, Osaka University, Suita, Osaka, 565-0871, Japan Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan 4JASRI/SPring-8, Sayo-gun, Hyogo 679-5198, Japan 5RIKENHarima Institute, Sayo, Hyogo 679-5148, Japan 6Skobeltsyn Institute of Nuclear Physics, Lomonosov Moscow State University, Moscow 119991,

Russia

Quantum Beam Science Center JAEA, Kizugawa, Kyoto 619-0215, Japan

seomakarov28@gmail.com

A relatively new and promising X-ray detector is a lithium fluoride (LiF) in the form of bulk crystal or thin film which demonstrated its performance as imaging tool in a wide range of applications including: visualization and characterization of focused x-ray beams, coherent x-ray beam metrology, X-ray radiography with large aspect ratio field-of-view/spatial resolution (in particular, in the interests of HEDP), phase-contrast imaging and quality control of nano-thickness foils etc.

In this work, the method applying LiF fluorescent media as a detector to perform a highresolution in situ imaging and control of various free electron laser (FEL) sources is introduced. It has been demonstrated in the experiments at BL3 SACLA-Spirng8 beam line that the use of the detector based on LiF crystals allowed to successfully visualize the intensity distribution of the X-ray beam by different focusing modes [1]. Experiments proved spatial resolution to be of ~ 700 nm for soft X-ray range, and of ~ 1.0 |im for 10 keV X-ray beam. Theoretical estimates on photoelectron cloud formation revealed fundamental limit on spatial resolution capability of the method. High sensitivity and uniquely large dynamic range exceeding 106 of LiF crystal detector allowed measurements on the intensity distribution of hard X-ray SACLA XFEL beam at distances as far from the focal plane, as near the best focus. Also considering the diffraction patterns from test objects, spectral and coherent properties of X-ray beams were revealed. The importance of such controlled measurements and the performance of the suggested method were demonstrated in the experiments with SASE-FEL and plasma-based X-ray lasers [2].

References

[1] T.A. Pikuz et al. 2015 Scientific Reports 5:17713

[2] T.A. Pikuz et al. 2012 Proc. of SPIE Vol. 8678

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