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10Complex Systems of Charged Particles and their Interactions with Electromagnetic Radiation 2018
DETERMINATION OF THE ABSOLUTE INTENSITIES OF X-RAYS EMITTED DURING IRRADIATION OF THIN SI FOILS BY PETAWATT LASER PULSES.
Arich D.D.12,@, Ryazantsev S.N.1, Skobelev I.Yu.12, Faenov A.Ya.1,3, Alkhimova M.A.12,
Filippov E.D.12, Pikuz S.A.1,2
Joint Institute for High Temperatures of the Russian Academy of Sciences, Izhorskaya 13 Bldg 2,
Moscow 125412, Russia
2National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe
Shosse 31, Moscow 115409, Russia 3Open and Transdisciplinary Research Initiative, Osaka University, 1-1 Yamadaoka, Suita, Osaka 5650871, Japan arich.ru@mail.ru
Nowadays, x-ray spectroscopy methods are widely used for fundamental research of atoms, molecules and macroscopic bodies constructed of them. Due to the imperfection of spectrometric instruments and the peculiarities of carrying out each experiment, recorded data requires correct interpretation. Elimination of spectrum distortions associated with errors in measuring equipment by considering a hardware function of a spectrometric path is an actual problem, since most x-ray spectral diagnostic methods are based on an analysis of the characteristic features of the recorded spectrum.
For the most cases the relative intensities of spectral lines are sufficient for most methods of x-ray spectral analysis. However, the real luminosity of the x-ray source produced by the interaction of high-power laser pulses with solid targets is an important parameter, which gives an understanding for the distribution of the primary energy input along different excitation channels. So, for obtain the real shape of the spectrum, we have considered influence of all parts of the spectrometric path used for X-ray detection and recalculated a spectrum recorded during irradiation of thin Si foils by PW laser pulses to real values: photons/angstrom.
